Title of article :
Electronic transport properties of coupled single-electron transistors
Author/Authors :
Shin، نويسنده , , M. and Lee، نويسنده , , S. and Park، نويسنده , , K.W. and Kim، نويسنده , , G.-H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
527
To page :
532
Abstract :
The electronic transport properties of parallel coupled single-electron transistors (SETs) at strong coupling under asymmetrical voltage bias are investigated theoretically. The binding of electrons and holes on the two islands of the coupled SETs is found to be the key element that governs the transport characteristics. The discrete nature of bound electrons and holes leads to the satellite Coulomb blockade oscillations, the current jumps, and the Coulomb staircases, all of which are distinct transport features of the coupled SETs.
Keywords :
A. Nanostructures , B. Electronic transport , C. Tunneling
Journal title :
Solid State Communications
Serial Year :
2000
Journal title :
Solid State Communications
Record number :
1786221
Link To Document :
بازگشت