Title of article :
Photoreflectance spectroscopy of vertically coupled InGaAs/GaAs double quantum dots
Author/Authors :
S?k، نويسنده , , G and Ryczko، نويسنده , , K and Misiewicz، نويسنده , , J and Bayer، نويسنده , , M and Klopf، نويسنده , , F and Reithmaier، نويسنده , , J.P and Forchel، نويسنده , , A، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
6
From page :
401
To page :
406
Abstract :
Photoreflectance and high excitation photoluminescence spectra have been measured at 10 K for In0.6Ga0.4As/GaAs double quantum dot structures with various thicknesses of the GaAs separating layer. Several transitions between split states, due to the dot–dot and wetting layer well–well interaction, have been observed. The transitions have been identified using the results of the effective mass approximation calculations for double quantum wells and lens-shaped double quantum dots. The splitting energy of the quantum dot transitions has been obtained as function of the GaAs barrier width.
Keywords :
D. Electronic states (localized) , E. Photoreflectance spectroscopy , A. Nanostructures , A. Semiconductors
Journal title :
Solid State Communications
Serial Year :
2001
Journal title :
Solid State Communications
Record number :
1786487
Link To Document :
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