Title of article
Zinc oxide nanoparticles incorporated in ultrathin layer silicate films and their photocatalytic properties
Author/Authors
Szabَ، نويسنده , , Tamلs and Németh، نويسنده , , Jَzsef and Dékلny، نويسنده , , Imre، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
13
From page
23
To page
35
Abstract
This study has been conducted to determine whether the nanosized semiconductor crystals qualify as photocatalysts also in that case when they are self-assembled to form ultrathin films in the thickness range of 10–500 nm. For this purpose, multilayer films of Zn(OH)2 and ZnO nanoparticles were prepared by the layer-by-layer self-assembly method on glass surface. A transparent layer silicate, synthetic hectorite was used as sticking material. The quality of multilayer formation has been investigated in detail by absorption spectrophotometry, XRD and atomic force microscopy (AFM). Evidence was found for the uniform deposition of the different components. The increment of nanofilm thickness was constant and independent from the number of layers deposited previously. Photocatalytic measurements were made with model organic materials β-naphtol and industrial kerosene in a home-made loop-type batch reactor. Decomposition has been continously monitored by UV spectrometry. Significant photodegradation of the organic molecules were only found in the presence of the nanofilms.
Keywords
AFM , semiconductor nanoparticles , Photodegradation , XRD , Ultrathin films , Layer silicates
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Serial Year
2003
Journal title
Colloids and Surfaces A Physicochemical and Engineering Aspects
Record number
1786856
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