Title of article
Anisotropic electric properties of Copper-(II)-Phthalocyanine thin films characterized by a near-field microwave microscope
Author/Authors
Jongchel and Babajanyan، نويسنده , , Arsen and Enkhtur، نويسنده , , Lkhamsuren and Khishigbadrakh، نويسنده , , Balt-Erdene and Melikyan، نويسنده , , Harutyun and Yoon، نويسنده , , Youngwoon and Kim، نويسنده , , Songhui and Lee، نويسنده , , Hanju and Kim، نويسنده , , Taedong and Lee، نويسنده , , Kiejin and Friedman، نويسنده , , Barry، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2011
Pages
5
From page
166
To page
170
Abstract
To study the anisotropic electric transport properties of Copper-(II)-Phthalocyanine (CuPc) thin films we measured the conductivity of a CuPc organic field-effect transistor using a near-field scanning microwave microscope by measuring the microwave reflection coefficient S11. The orientation of grains depended on the heat-treatment condition and the temperature of the substrate during film deposition. The field-effect mobility of the CuPc thin film annealed at 300 °C was increased about 5 times compared to the film formed at room temperature and 17 times larger than that prepared by deposition at 300 °C.
Keywords
Field-effect transistor , CuPc , Microwave microscope , Near-Field , Treatment conditions
Journal title
Current Applied Physics
Serial Year
2011
Journal title
Current Applied Physics
Record number
1787579
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