Author/Authors :
Gommes، نويسنده , , C and Blacher، نويسنده , , S and Dupont-Pavlovsky، نويسنده , , N and Bossuot، نويسنده , , C and Lamy، نويسنده , , M and Brasseur، نويسنده , , A and Marguillier، نويسنده , , D and Fonseca، نويسنده , , A and McRae، نويسنده , , E and B.Nagy، نويسنده , , J and Pirard، نويسنده , , J.-P، نويسنده ,
Abstract :
Four complementary and independent methods are used to characterize nanotube samples: (i) TEM observation coupled with image analysis, (ii) nitrogen and krypton adsorption isotherm analysis, (iii) thermogravimetry and (iv) wide angle X-ray scattering. The methodology is discussed on the basis of two multi-walled carbon nanotube samples produced by the CCVD technique with very different reaction rates. It is shown that the total amount of deposited carbon is larger for the sample produced at the higher rate, that the fraction of nanotubes in the deposited carbon does not seem to be significantly different, but that the crystallinity of the nanotubes wall is larger for the sample produced at the lowest reaction rate.
Keywords :
Carbon nanotubes , Image analysis , Gas adsorption , X-Ray scattering , Thermogravimetry