Title of article :
Localized exciton dynamics in AlInGaN alloy
Author/Authors :
Huang، نويسنده , , J.S and Dong، نويسنده , , X and Luo، نويسنده , , X.D. and Liu، نويسنده , , X.L and Xu، نويسنده , , Z.Y. and Ge، نويسنده , , W.K، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Carrier recombination dynamics in AlInGaN alloy has been studied by photoluminescence (PL) and time-resolved PL (TRPL) at various temperatures. The fast red-shift of PL peak energy is observed and well fitted by a physical model considering the thermal activation and transfer processes. This result provides evidence for the exciton localization in the quantum dot (QD)-like potentials in our AlInGaN alloy. The TRPL signals are found to be described by a stretched exponential function of exp[(−t/τ)β], indicating the presence of a significant disorder in the material. The disorder is attributed to a randomly distributed QDs or clusters caused by indium fluctuations. By studying the dependence of the dispersive exponent β on temperature and emission energy, we suggest that the exciton hopping dominate the diffusion of carriers localized in the disordered QDs. Furthermore, the localized states are found to have 0D density of states up to 250 K, since the radiative lifetime remains almost unchanged with increasing temperature.
Keywords :
A. AlInGaN , D. Hopping , D. Stretched-exponential decay , A. Quantum dots
Journal title :
Solid State Communications
Journal title :
Solid State Communications