Title of article :
Atomic force microscopy of bamboo-shaped multiwalled carbon nanotube structures
Author/Authors :
Jang، نويسنده , , J.W and Lee، نويسنده , , C.E. and Lee، نويسنده , , T.J. and Lee، نويسنده , , C.J. and Noh، نويسنده , , S.J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Atomic force microscopy (AFM) was employed for the morphology measurements of bamboo-shaped multiwalled carbon nanotubes (BS-MWNTs) grown by thermal chemical vapor deposition on Fe catalyst deposited SiO2/Ti substrates. Greater diameters and compartment distances of the bamboo structures were observed for the BS-MWNTs grown at 950 °C than for those grown at 850 °C.
Keywords :
A. Nanostructures , B. Thermal chemical vapor deposition , C. Atomic force microscopy , D. Growth temperature dependent morphology
Journal title :
Solid State Communications
Journal title :
Solid State Communications
