Title of article :
Electrical current induced mechanism in microstructure and nano-indention of Al–Zn–Mg–Cu (AZMC) Al alloy thin film
Author/Authors :
Hung، نويسنده , , Fei-Yi and Liao، نويسنده , , Jiunn-Der and Lui، نويسنده , , Truan-Sheng and Chen، نويسنده , , Li-Hui، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2011
Pages :
5
From page :
1269
To page :
1273
Abstract :
In this study, the microstructural variation and nano-indention of Al-5.7Zn-2.4Mg-1.5Cu (AZMC) thin film was investigated using DC electrical current at a density of 1000 A/cm2. The results show that microstructural changes due to the electrical current involved both the solid solubility effect and enhanced diffusion. The electrical current drove the Al atoms and Cu atoms of the matrix from the cathode to the anode. After electrical current testing, precipitation phases (Al2Cu; CuMgAl2) had decomposed into the cathode matrix and MgZn phases had grown in the anode zones. Meanwhile, the current also caused the hardness of the thin film to decrease and affected both the texture and dynamic strain mechanism of nano-indention.
Keywords :
TEM , Electrical current , Al alloy , Nano-indention
Journal title :
Current Applied Physics
Serial Year :
2011
Journal title :
Current Applied Physics
Record number :
1788439
Link To Document :
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