Title of article :
Theoretical explanation of the g factor for Cr4+ in Y2SiO5 crystal
Author/Authors :
Xiao-Xuan، نويسنده , , Wu and Wen-Chen، نويسنده , , Zheng-Mao Sheng، نويسنده , , Tang and Jian، نويسنده , , Zi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
93
To page :
96
Abstract :
The g factor of Cr4+ in Y2SiO5 crystal is calculated from a completed high-order perturbation formula, in which not only the conventional contribution to the g-shift Δg(=g−ge) from the crystal-field mechanism, but also the contribution from the charge-transfer mechanism (which is neglected in the crystal-field theory) are considered. The calculated result shows good agreement with the observed value. It is found that the calculated Δg due to the charge-transfer mechanism is opposite in sign and about 38% in magnitude, compared with that due to the crystal-field mechanism. So, in the studies of the g factor for a 3dn ion having high valence state in crystals, the contribution due to the charge-transfer mechanism should be taken into account.
Keywords :
D. Electronic states (localized) , E. Electron paramagnetic resonance , A. Insulators , C. Points defects , D. Crystal and ligand fields
Journal title :
Solid State Communications
Serial Year :
2004
Journal title :
Solid State Communications
Record number :
1789038
Link To Document :
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