Title of article :
Hard X-ray photoelectron spectroscopy from 5–14.5 keV
Author/Authors :
Thiess، نويسنده , , S. and Kunz، نويسنده , , C. and Cowie، نويسنده , , B.C.C. and Lee، نويسنده , , T.-L. and Renier، نويسنده , , M. and Zegenhagen، نويسنده , , J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
6
From page :
589
To page :
594
Abstract :
Photoemission spectroscopy at high energies can be used to probe bulk electronic states. We used a specially designed high-voltage retarding lens and a commercial Perkin–Elmer PHI 10-360 hemispherical electron analyzer to investigate the core and valence band region of Au, YBa2Cu3O7−δ and highly oriented pyrolytic graphite samples with hard X-rays in the energy range 5–14.5 keV. The overall instrumental resolution obtained at 8 keV was 218 meV. The photo ionization cross-sections for Au 5d and 6s excitations were determined experimentally. In comparison with published calculations for atomic cross-sections neglecting corrections for angular anisotropy, the values we find are twice as large for the 5d and an order of magnitude larger for the 6s (conduction band) level. Our results demonstrate the feasibility of bulk sensitive valence band spectroscopy with high resolution at high brilliance X-ray sources such as the ESRF. The measured cross-sections provide important input for improving current theoretical models.
Keywords :
E. X-ray and X-ray spectroscopies , E. Synchrotron radiation , E. Photoelectron spectroscopies , A. Surfaces and interfaces , D. Photoelectric cross-section
Journal title :
Solid State Communications
Serial Year :
2004
Journal title :
Solid State Communications
Record number :
1789380
Link To Document :
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