• Title of article

    Electron-beam assisted growth of hexagonal boron-nitride layer

  • Author/Authors

    Hwang، نويسنده , , B. and Kwon، نويسنده , , J. and Lee، نويسنده , , M. and Lim، نويسنده , , S.J. and Jeon، نويسنده , , S. and Kim، نويسنده , , S. and Ham، نويسنده , , U. and Song، نويسنده , , Y.J. and Kuk، نويسنده , , Y.، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2013
  • Pages
    5
  • From page
    1365
  • To page
    1369
  • Abstract
    It has been known that a good quality h-BN layer can only be grown within a narrow temperature window of 1020–1100 K on a copper substrate. We found that the growth temperature window on Cu(111) surface could be lowered up to 100 K by ionizing and/or exciting borazine precursor gas with an electron-beam. The structures of a hexagonal boron nitride (h-BN) layers grown at various substrate temperatures on a Cu(111) were examined using scanning tunneling microscopy. We found that the grown h-BN film exhibits highly inert behavior with wide bandgap semiconductor characteristics.
  • Keywords
    Borazine , Electron-beam , Scanning tunneling microscopy , hexagonal boron nitride
  • Journal title
    Current Applied Physics
  • Serial Year
    2013
  • Journal title
    Current Applied Physics
  • Record number

    1790986