Title of article
Youngʹs modulus of ZnO microwires determined by various mechanical measurement methods
Author/Authors
Kim، نويسنده , , Hakseong and Jung، نويسنده , , Un Seok and Kim، نويسنده , , Soo In and Yoon، نويسنده , , Duhee and Cheong، نويسنده , , Hyeonsik and Lee، نويسنده , , Chang-Woo and Lee، نويسنده , , Sang Wook، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2014
Pages
5
From page
166
To page
170
Abstract
The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Youngʹs moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5–79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm.
Keywords
ZnO microwire , Youngיs modulus , Nano indentation , Atomic Force Microscope , Optical interferometry
Journal title
Current Applied Physics
Serial Year
2014
Journal title
Current Applied Physics
Record number
1791641
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