Title of article
High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa
Author/Authors
Yubuta، نويسنده , , Kunio and Hongo، نويسنده , , Teruhisa and Atou، نويسنده , , Toshiyuki and Nakamura، نويسنده , , Kazutaka G. and Kondo، نويسنده , , Kenichi and Kikuchi، نويسنده , , Masae، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
4
From page
127
To page
130
Abstract
Microstructure of MnF2 subjected to by shock compression at 4.4 GPa was examined using transmission electron microscopy (TEM). Lamellar structure consisting of twin-related domains of rutile-structure and intergrowth of α - PbO2-type phase is observed in the electron diffraction pattern and TEM images. The crystallographic relationship between rutile and α - PbO2-type phases can be expressed as ( 1 ̄ 01 ) rutile ∥ ( 001 ) α -PbO 2 and [ 111 ] rutile ∥ [ 110 ] α -PbO 2 .
Keywords
A. Microstructure , B. Shock compression , C. Electron diffraction and high-resolution image , D. Phase transition
Journal title
Solid State Communications
Serial Year
2007
Journal title
Solid State Communications
Record number
1791726
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