Title of article :
High-resolution electron microscopy of microstructure of MnF2 subjected to shock compression at 4.4 GPa
Author/Authors :
Yubuta، نويسنده , , Kunio and Hongo، نويسنده , , Teruhisa and Atou، نويسنده , , Toshiyuki and Nakamura، نويسنده , , Kazutaka G. and Kondo، نويسنده , , Kenichi and Kikuchi، نويسنده , , Masae، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Abstract :
Microstructure of MnF2 subjected to by shock compression at 4.4 GPa was examined using transmission electron microscopy (TEM). Lamellar structure consisting of twin-related domains of rutile-structure and intergrowth of α - PbO2-type phase is observed in the electron diffraction pattern and TEM images. The crystallographic relationship between rutile and α - PbO2-type phases can be expressed as ( 1 ̄ 01 ) rutile ∥ ( 001 ) α -PbO 2 and [ 111 ] rutile ∥ [ 110 ] α -PbO 2 .
Keywords :
A. Microstructure , B. Shock compression , C. Electron diffraction and high-resolution image , D. Phase transition
Journal title :
Solid State Communications
Journal title :
Solid State Communications
