• Title of article

    Transport behaviors and mechanisms in cuspidal blockade region for silicon single-hole transistor

  • Author/Authors

    Lee، نويسنده , , Youngmin and Lee، نويسنده , , Sejoon and Hiramoto، نويسنده , , Toshiro، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2014
  • Pages
    5
  • From page
    428
  • To page
    432
  • Abstract
    The Si single-hole transistor displays the anomalously-extended cuspidal blockade region, which is elongated toward the 45°-tilted direction normal to gate vs. drain bias voltage regions in the Coulomb blockade diagram. This is attributed to the formation of an ultra small Si quantum dot (QD) into the gate-all-around (GAA) stack. Namely, the large one-electron-addition energy (= 447 meV) from the 2-nm-size Si QD enables the clear Coulomb-blockade events at room temperature, and the large voltage gain from the GAA stack allows the cuspidal extension of the blockade region through the renormalization of Coulomb-blockade energies at the adjacent bias points near the initial Coulomb-blockade state.
  • Keywords
    Silicon single-hole transistor , Extended blockade regime , Room temperature operation , Coulomb blockade oscillation , Negative differential conductance
  • Journal title
    Current Applied Physics
  • Serial Year
    2014
  • Journal title
    Current Applied Physics
  • Record number

    1791851