Title of article
Effect of p–d hybridization and structural distortion on the electronic properties of AgAlM2(M=S,Se,Te) chalcopyrite semiconductors
Author/Authors
Mishra، نويسنده , , S. and Ganguli، نويسنده , , B.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
6
From page
523
To page
528
Abstract
We report an ab initio calculation and study of the structural and electronic properties of AgAlM2(M=S,Se,Te) chalcopyrite semiconductors using the density functional theory (DFT)-based self-consistent tight-binding linear muffin tin orbital (TB-LMTO) method. The calculated equilibrium values of the lattice constants, anion displacement parameter ( u ) , tetragonal distortion ( η = c / 2 a ) and bond lengths are in good agreement with experimental values. Our study suggests these semiconductors to be direct band gap semiconductors with band gaps 1.98 eV, 1.59 eV and 1.36 eV, respectively. These values are in good agreement with experimental values, within the limitation of the local density approximation (LDA). Our explicit study of the effects of anion displacement and p–d hybridization show that the band gap increases by 9.8%, 8.2% and 5.1%, respectively, for AgAlM2(M=S,Se,Te) due to former effect and decreases by 51%, 47% and 42%, respectively, due to latter effect.
Keywords
A. Semiconductors , E. Density functional theory , E. TB-LMTO , A. Chalcopyrite
Journal title
Solid State Communications
Serial Year
2011
Journal title
Solid State Communications
Record number
1792272
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