Title of article :
Hydrogen passivation effect on the yellow–green emission band and bound exciton in n - ZnO
Author/Authors :
Kim، نويسنده , , Moon-Deock and Oh، نويسنده , , Jae-Eung and Kim، نويسنده , , Song-Gang and Yang، نويسنده , , Woo Chul، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Pages :
3
From page :
768
To page :
770
Abstract :
Photoluminescence (PL) measurements performed on as-grown, hydrogenated, and annealed n -type ZnO bulk samples investigated the origins of their yellow (2.10 eV) and green (2.43 eV) emission bands. After hydrogenation, the defect-related peak at 2.10 eV was no longer present in the room temperature PL spectrum, the peak intensity at 2.43 eV was unchanged, and the intensity of the emission peak at 3.27 eV increased significantly. These results indicate that yellow band emission is due to oxygen vacancies, as the emission peak at 2.10 eV disappears when hydrogen atoms passivate these vacancies. The emission peak at 2.43 eV originates from complexes between oxygen vacancies and other crystal defects. We discuss the shallow donor impurities arising due to these hydrogen atoms in the ZnO bulk sample.
Keywords :
A. Semiconductors , B. Crystal growth , C. Impurities in semiconductors , D. Optical properties
Journal title :
Solid State Communications
Serial Year :
2011
Journal title :
Solid State Communications
Record number :
1792385
Link To Document :
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