Title of article :
Low temperature thermoelectric properties of Bi2−xSbxTeSe2 crystals near the n–p crossover
Author/Authors :
M.K. Fuccillo، نويسنده , , M.K. and Charles، نويسنده , , M.E. and Hor، نويسنده , , Y.S. and Jia، نويسنده , , Shuang and Cava، نويسنده , , R.J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
4
From page :
1208
To page :
1211
Abstract :
Seebeck coefficients, electrical resistivities, thermal conductivities and figure of merit ZT of Bi2−xSbxTeSe2 crystals (x=0.8, 0.9, 1.0, 1.1, and 1.2) measured along the hexagonal basal plane are presented. The crystals gradually change from n- to p-type with increasing Sb content, with the crossover lying in the region between x=1.0 and 1.1. The crossover is accounted for by a simple (p–n) electron-hole compensation model, as supported by carrier concentrations determined from Hall measurements. ZT was found to be maximized near the crossover on the p-type side, with the high electrical resistance of the Se-rich crystals apparently the limiting factor in the performance. These materials may serve as a basis for future nanostructuring or doping studies.
Keywords :
D. Electronic transport , B. Doping , D. Thermoelectric , A. Semiconductors
Journal title :
Solid State Communications
Serial Year :
2012
Journal title :
Solid State Communications
Record number :
1793435
Link To Document :
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