Title of article
Negative thermal quenching of the 3.338 eV emission in ZnO nanorods
Author/Authors
Wu، نويسنده , , Kewei and He، نويسنده , , Haiping and Lu، نويسنده , , Yangfan and Huang، نويسنده , , Jingyun and Ye، نويسنده , , Zhizhen، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
4
From page
1757
To page
1760
Abstract
We investigate the negative thermal quenching behavior of the 3.338 eV emission in ZnO nanorods. A correlation between the 3.338 eV and the 3.368 eV (surface exciton) emissions is determined from temperature-dependent photoluminescence. The activation energies of the 3.338 eV emission, obtained using an approximated multi-level model, indicate an trap state between the two surface exciton emissions. The present study demonstrates a nondestructive and easy method to understand the surface effects on the optical properties of semiconductor nanostructures.
Keywords
A. Nanostructures , D. Photoluminescence , A. Semiconductors
Journal title
Solid State Communications
Serial Year
2012
Journal title
Solid State Communications
Record number
1793651
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