• Title of article

    Oxygen diffusion across the grain boundary in bicrystal yttria stabilized zirconia

  • Author/Authors

    Park، نويسنده , , Joong Sun and Kim، نويسنده , , Young-Beom and An، نويسنده , , Jihwan and Prinz، نويسنده , , Fritz B.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2012
  • Pages
    3
  • From page
    2169
  • To page
    2171
  • Abstract
    Electrochemical impedance spectroscopy (EIS) measurements in yttria stabilized zirconia (YSZ) with a single Σ13(510)/[001] grain boundary in a common SOFC electrolyte showed that oxide ion diffusion is blocked when it jumps across the grain boundary at operating temperatures between 300 and 525 °C. The EIS results are supported by secondary ion mass spectrometry (SIMS) measurements combined with oxygen isotope annealing on the bicrystal YSZ. The SIMS results showed that the 18O/16O+18O ratio dropped sharply near the grain boundary regions.
  • Keywords
    A. Oxide ion conducting ceramic , C. Bi-crystal structure , D. Ionic conduction thorough grain boundary , E. EIS and SIMS.
  • Journal title
    Solid State Communications
  • Serial Year
    2012
  • Journal title
    Solid State Communications
  • Record number

    1793821