Title of article
Oxygen diffusion across the grain boundary in bicrystal yttria stabilized zirconia
Author/Authors
Park، نويسنده , , Joong Sun and Kim، نويسنده , , Young-Beom and An، نويسنده , , Jihwan and Prinz، نويسنده , , Fritz B.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
3
From page
2169
To page
2171
Abstract
Electrochemical impedance spectroscopy (EIS) measurements in yttria stabilized zirconia (YSZ) with a single Σ13(510)/[001] grain boundary in a common SOFC electrolyte showed that oxide ion diffusion is blocked when it jumps across the grain boundary at operating temperatures between 300 and 525 °C. The EIS results are supported by secondary ion mass spectrometry (SIMS) measurements combined with oxygen isotope annealing on the bicrystal YSZ. The SIMS results showed that the 18O/16O+18O ratio dropped sharply near the grain boundary regions.
Keywords
A. Oxide ion conducting ceramic , C. Bi-crystal structure , D. Ionic conduction thorough grain boundary , E. EIS and SIMS.
Journal title
Solid State Communications
Serial Year
2012
Journal title
Solid State Communications
Record number
1793821
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