• Title of article

    Few-layer graphene under high pressure: Raman and X-ray diffraction studies

  • Author/Authors

    Clark، نويسنده , , S.M. and Jeon، نويسنده , , Ki-Joon and Chen، نويسنده , , Jing-Yin and Yoo، نويسنده , , Choong-Shik، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2013
  • Pages
    4
  • From page
    15
  • To page
    18
  • Abstract
    The effect of pressure on the structure of few-layer graphene has been investigated to 50 GPa in both quasi-hydrostatic and non-hydrostatic conditions, using X-ray diffraction and Raman spectroscopy. The results indicate that few-layer graphene loses its long-range order at the critical interlayer distance of ∼2.8 Å (or above ∼18 GPa), while maintaining the local sp2 hybridization in the layer to 50 GPa. This suggests that graphene not only has the highest stability of all graphitic layer structures, but also becomes one of the most healable structures under large stress.
  • Keywords
    C. X-ray diffraction , C. Raman spectroscopy , E. Synchrotron radiation , E. High-pressure , A. Graphene
  • Journal title
    Solid State Communications
  • Serial Year
    2013
  • Journal title
    Solid State Communications
  • Record number

    1793872