Author/Authors :
Harano، نويسنده , , T. and Shibata، نويسنده , , G. and Yoshimatsu، نويسنده , , K. and Ishigami، نويسنده , , K. and Verma، نويسنده , , V.K. and Takahashi، نويسنده , , Y. and Kadono، نويسنده , , T. and Yoshida، نويسنده , , T. and Fujimori، نويسنده , , A. and Koide، نويسنده , , T. and Chang، نويسنده , , F.-H. and Lin، نويسنده , , H.-J. and Huang، نويسنده , , D.-J. and Chen، نويسنده , , C.-T. and Xiang، نويسنده , , P.-H. and Yamada، نويسنده , , H. and Sawa، نويسنده , , A.، نويسنده ,
Abstract :
In the perovskite-type Ca1−xCexMnO3 (CCMO), one can control the transport and magnetic properties through varying Ce content. In the case of thin films, the properties can also be controlled by epitaxial strain from the substrate through changing it such as YAlO3 (YAO), NdAlO3 (NAO), and LaSrAlO4 (LSAO). However, one cannot measure the magnetization of thin films on NAO substrates by conventional magnetization measurements because of the strong paramagnetic signals from the Nd3+ ions. In order to eliminate the influence of Nd3+ and to identify magnetic phases of the CCMO thin films, we have performed element-selective X-ray magnetic circular dichroism (XMCD) measurements of the Mn 2p core level. By studying the anisotropy of the XMCD intensity, we could unambiguously determine the magnetic phase diagram of the CCMO thin films.
