Author/Authors :
Vac??k، نويسنده , , J. and ?erven?، نويسنده , , J. and Hnatowicz، نويسنده , , V. and Po?ta، نويسنده , , S. F. Fink IV، نويسنده , , D. and Klett، نويسنده , , Noelle R. and Strauss، نويسنده , , P.، نويسنده ,
Abstract :
A simple technique for examination of inhomogeneities in thin foils, based on the measurement of the energy spectra of charged particles transmitted through the examined object, is described and some experimental results are presented proving the feasibility of the technique. A Monte Carlo simulation code was developed for simulation of the experimental spectra. The simulations are in reasonable agreement with experiment and they can describe fine details of the measured spectra. By comparing the simulated and the measured spectra it is possible to obtain quantitative information on the microscopic structure of the object investigated. The technique may be used for the investigation of the etching of latent ion tracks in polymers.
