Title of article :
The structure of thin zirconia films obtained by self-assembled monolayer mediated deposition: TEM and HREM study
Author/Authors :
Roddatis، نويسنده , , V.V. and Su، نويسنده , , D.S. and Beckmann، نويسنده , , E. and Jentoft، نويسنده , , F.C. and Braun، نويسنده , , U. and Krِhnert، نويسنده , , J. and Schlِgl، نويسنده , , R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
Transmission electron microscopy (TEM), electron energy-loss spectroscopy (EELS), and energy dispersive X-ray analysis (EDX) have been performed on thin zirconia films produced by means of self-assembled monolayer (SAM) mediated deposition from aqueous zirconium sulfate dispersion at 50 °C. As-grown films were found to be amorphous. Electron beam irradiation can induce crystallization of the as-grown amorphous zirconia films to tetragonal polycrystalline ZrO2 films. EELS revealed changes in the oxygen K-edge peak caused by the beam-induced structural transition of the amorphous phase to tetragonal ZrO2.
Keywords :
Self-assembled monolayer , Zirconia , structure , Transmission electron microscopy
Journal title :
Surface and Coatings Technology
Journal title :
Surface and Coatings Technology
