Annealing studies of electrodeposited zinc telluride thin films

Zinc telluride (ZnTe) thin films were prepared potentiostatically from an aqueous solution bath containing ZnSO4 and TeO2. Structural studies were carried out for films deposited at various potentials and lattice parameters were evaluated using the Nelson–Riley plot. The effects of annealing on the structural, optical and morphological behavior were studied. Current–voltage studies revealed a space charge limited conduction mechanism and the trap density of films was estimated. The microscopic composition was analyzed by EDAX, XPS and the results are discussed.