Title of article :
PAC study of Ni-irradiated Sb films
Author/Authors :
Zofia Szweykowska-Kulinska، نويسنده , , A and Lieb، نويسنده , , K.-P and Uhrmacher، نويسنده , , M and Wodniecki، نويسنده , , P، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
The Perturbed Angular Correlation method with 111In tracers was applied to investigate the influence of implanted nickel impurities on the electric field gradient (EFG) in antimony films. A very strong dependence of EFG at low Ni concentrations was found. Ni implantations and thermal annealings did not destroy the texture produced during the deposition of the Sb films on Si (100) substrates.
Keywords :
Peturbed angular correlation , 111In , Sb film , Ni implantation
Journal title :
Surface and Coatings Technology
Journal title :
Surface and Coatings Technology
