Structural, magnetic and magnetoelectrical properties of La1−xSrxMnO3 thin films prepared by metal-organic decomposition

La1−xSrxMnO3 thin films with x=0.1, 0.33 and 0.6 were prepared on amorphous quartz substrate by metal-organic decomposition. X-ray diffraction spectra showed that the films were polycrystalline oriented mainly to the (1 0 1) direction. Atomic force microscope measurement indicated that the average grain size of the films were 200 nm with a root-mean-square roughness approximately 8.2 nm. SQUID measurement from 5 to 360 K revealed that the magnetization in La1−xSrxMnO3 thin films decreased with increasing temperature for x equal to or less than 0.33. For La0.67Sr0.33MnO3 samples, a good field linearity and reversibility of magnetoresistance (MR) were observed at 300 K and a low magnetic field MR was found at 77 K.