Title of article :
Time-resolved plasma measurement in a high-power pulsed ICP source for large area
Author/Authors :
Kim، نويسنده , , Young-Woo and Jung، نويسنده , , Young-Dae and Han، نويسنده , , Seunghee and Lee، نويسنده , , Yeonhee and Kim، نويسنده , , Gon-Ho، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
161
To page :
164
Abstract :
Spatial and temporal evolution of the plasma parameters in a pulsed inductively coupled discharge for plasma source ion implantation (PSII) process was studied experimentally. Langmuir probe current and voltage measurements were performed to determine the plasma parameters. To measure the time-resolved plasma parameters automatically, data acquisition (DAQ) system was designed using a LabVIEW® program and interfaced to a computer with data acquisition card. Time-resolved plasma parameters consisted of two regions: RF pulse ON time and OFF time. Experiments revealed that the plasma parameters reached a steady state at about 500 μs after the RF pulse ON and they shrunk gradually after the end of the RF pulse. It was also observed that the radial and axial profiles of plasma density were uniform in large area plasma chamber at peak RF power below 20 kW.
Keywords :
LABVIEW , Time-resolved Langmuir probe , Pulsed plasma
Journal title :
Surface and Coatings Technology
Serial Year :
2004
Journal title :
Surface and Coatings Technology
Record number :
1808347
Link To Document :
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