Title of article :
Room temperature epitaxial growth of TiN on SiC
Author/Authors :
Yang، نويسنده , , Shang-Shian and Lin، نويسنده , , Yan-Ru and Wu، نويسنده , , Shinn-Tyan Wu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
4
From page :
4850
To page :
4853
Abstract :
Epitaxial growth of a titanium nitride (TiN) on (6H)-SiC (0001) is achieved at room temperature by means of direct current magnetron sputtering. The epitaxial relationship is established by X-ray pole figure and Φ-scan. Cross-sectional transmission electron microscopy and pole figure analysis show that the orientation relationship is ( 111 ) TiN ‖ ( 0001 ) SiC [ 0 1 ¯ 1 ] TiN ‖ [ 1 2 ¯ 10 ] SiC , It is different from that on sapphire, “ ( 111 ) TiN ‖ ( 0001 ) Al 2 O 3 [ 10 1 ¯ ] TiN ‖ [ 10 1 ¯ 0 ] Al 2 O 3 ” , in spite of the same crystal structure of substrate surfaces. Different lattice mismatch is a plausible explanation.
Keywords :
silicon carbide , Transmission electron microscopy (TEM) , Direct current (DC) , Titanium nitride , X-ray diffraction , reactive sputtering
Journal title :
Surface and Coatings Technology
Serial Year :
2007
Journal title :
Surface and Coatings Technology
Record number :
1815211
Link To Document :
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