Title of article
Fabrication of heteroepitaxial Si films on sapphire substrates using mesoplasma CVD
Author/Authors
Sawayanagi، نويسنده , , M. and Diaz، نويسنده , , J.M. and Kambara، نويسنده , , M. and Yoshida، نويسنده , , T.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
4
From page
5592
To page
5595
Abstract
Heteroepitaxial silicon films have been deposited on (1102) oriented sapphire substrates by mesoplasma chemical vapor deposition (MPCVD) at various substrate temperatures. At a temperature of 600 °C, the film was obtained at a relatively fast deposition rate of 6 nm/s, and the deposition rate further increased to 8.3 nm/s at higher temperature of 770 °C. This is an evidence of the advantage of the MPCVD for low temperature and high rate deposition compared to other heteroepitaxial processes, such as MBE and thermal CVD.
Keywords
Silicon , heteroepitaxy , chemical vapor deposition , Mesoplasma , Silicon on sapphire
Journal title
Surface and Coatings Technology
Serial Year
2007
Journal title
Surface and Coatings Technology
Record number
1815818
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