Title of article :
On the relationship between the structure and the barrier performance of plasma deposited silicon dioxide-like films
Author/Authors :
Coclite، نويسنده , , Anna Maria and Milella، نويسنده , , Antonella and dʹAgostino، نويسنده , , Riccardo and Palumbo، نويسنده , , Fabio، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
6
From page :
4012
To page :
4017
Abstract :
Silicon dioxide-like barrier films were deposited by plasma enhanced chemical vapor deposition from different siloxane and silane precursors. The variation of the precursor was investigated as a route to obtain silicon dioxide-like films with different structures, densities and hence barrier performances. gh the films were characterized by the same elemental composition, some differences in film density and porosity were evidenced from optical properties measurements and from the shift of the SiOSi infrared absorption band position. These differences were correlated with film microstructure and in turn with barrier performances. The results confirmed that films with high density and low porosity performed better as single inorganic barrier layers for food-packaging.
Keywords :
Silicon dioxide , barrier coatings , FT-IR , Plasma deposition
Journal title :
Surface and Coatings Technology
Serial Year :
2010
Journal title :
Surface and Coatings Technology
Record number :
1822832
Link To Document :
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