Title of article :
Interface analysis of inorganic films on polyimide with atomic oxygen exposure
Author/Authors :
Huang، نويسنده , , Yongxian and Lv، نويسنده , , Shixiong and Tian، نويسنده , , Xiubo and Fu، نويسنده , , Ricky K.Y and Chu، نويسنده , , Paul K.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
6
From page :
121
To page :
126
Abstract :
Inorganic silica/alumina multilayer films with excellent mechanical and anti-atomic-oxygen erosion properties were fabricated on polyimide by the hybrid implanting and depositing processes. X-ray photoelectron spectroscopy demonstrated that the silica/alumina graded structures consisted of SiO and AlO bonds, as well as AlOSi and AlOC bonds in the transition layers. The results revealed that bonding between the alumina coating and the polymer occurred primarily via AlOC bonds, and SiOAl bonds were formed in the interface between silica and alumina coatings. The multilayer films presented good adhesion property, demonstrating that balanced internal stresses and alternating bonding structures were crucial for enhancing anti-crack performance. The multilayer inorganic films exhibited good anti-atomic-oxygen erosion properties were well matched with the behavior of adhesion property.
Keywords :
Inorganic films , Atomic oxygen , Plasma immersion ion implantation/deposition , erosion , X-ray photoelectron spectroscopy
Journal title :
Surface and Coatings Technology
Serial Year :
2013
Journal title :
Surface and Coatings Technology
Record number :
1827186
Link To Document :
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