Author/Authors :
???ek، نويسنده , , J. and Melikhova، نويسنده , , O. and Vl?ek، نويسنده , , M. and Lukac، نويسنده , , F. and Vlach، نويسنده , , M. and Proch?zka، نويسنده , , I. and Anwand، نويسنده , , W. and Brauer، نويسنده , , G. and Mücklich، نويسنده , , A. and Wagner، نويسنده , , S. and Uchida، نويسنده , , H. and Pundt، نويسنده , , A.، نويسنده ,
Abstract :
The development of the microstructure in nanocrystalline, polycrystalline and epitaxial Pd films loaded with hydrogen is investigated. Structural changes in Pd films loaded with hydrogen were characterized by positron annihilation spectroscopy combined with electron microscopy and X-ray diffraction. It was found that hydrogen charging causes plastic deformation which leads to an increase of the defect density in all Pd films studied. Moreover, the formation of buckles was observed in nanocrystalline and polycrystalline Pd films loaded above a certain critical hydrogen concentration. Buckling leads to detachment of the film from the substrate and this is accompanied with in-plane stress relaxation and plastic deformation of the film.
Keywords :
Hydrogen , Palladium films , Positron annihilation spectroscopy , X-ray diffraction
