Title of article :
Recognition of semiconductor defect patterns using spatial filtering and spectral clustering
Author/Authors :
Chih-Hsuan Wang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
10
From page :
1914
To page :
1923
Keywords :
Defect pattern , Fuzzy clustering , Data mining , Spectral clustering
Journal title :
Expert Systems with Applications
Serial Year :
2008
Journal title :
Expert Systems with Applications
Record number :
187004
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=187004
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