Title of article :
Novel yield model for integrated circuits with clustered defects
Author/Authors :
Lee-Ing Tong، نويسنده , , Li-Chang Chao، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
8
From page :
2334
To page :
2341
Keywords :
Clustered defects , General regression neural network , pattern , Yield model , IC
Journal title :
Expert Systems with Applications
Serial Year :
2008
Journal title :
Expert Systems with Applications
Record number :
187048
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=187048
بازگشت