مرکز منطقه ای اطلاع رساني علوم و فناوري - Modeling semiconductor testing job scheduling and dynamic testing machine configuration

Title of article :

Modeling semiconductor testing job scheduling and dynamic testing machine configuration

Author/Authors :

Jei-Zheng Wu، نويسنده , , Chen-Fu Chien، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2008

Pages :

From page :

485

To page :

496

Keywords :

Scheduling , Genetic algorithm , Semiconductor final testing , Machine configuration , Intelligent manufacturing , Timetabling

Journal title :

Expert Systems with Applications

Serial Year :

2008

Journal title :

Expert Systems with Applications

Record number :

187175

Link To Document :