Title of article :
H atom-induced oxidation reaction on water-terminated Si surface, 2H + H2O/Si(1 0 0)–(2 × 1): A theoretical study
Author/Authors :
Watanabe، نويسنده , , Hidekazu and Wang، نويسنده , , Zhi-Hong and Nanbu، نويسنده , , Shinkoh and Maki، نويسنده , , Jun and Urisu، نويسنده , , Tsuneo and Aoyagi، نويسنده , , Mutsumi and Ooi، نويسنده , , Kenta، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
6
From page :
347
To page :
352
Abstract :
The reported oxidation reaction observed by BML-IRRAS spectra on the silicon surface system, 2H + H2O/Si(1 0 0), has been studied by an ab initio molecular orbital method. The highest transition state is found at ≈+25 kJ/mol from the reactant energy level, and the oxidation occurs easily under the experimental condition. The present study also accounts for the reactivity deduced from the absorption bands in the IR spectra. It is noted that the quenching of the reaction by thermal relaxation is impossible because the surface is not trapped into the metastable states located much lower in energy than the reactant.
Journal title :
Chemical Physics Letters
Serial Year :
2005
Journal title :
Chemical Physics Letters
Record number :
1916222
Link To Document :
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