Author/Authors :
Ghorbal، نويسنده , , Achraf and Arfi، نويسنده , , Rim Ben and Bistac، نويسنده , , Sophie and Brogly، نويسنده , , Maurice، نويسنده ,
Abstract :
Polarization–modulation infrared reflection–absorption spectroscopy (PMIRRAS) measurements have been carried out so as to analyze atactic polystyrene layers transferred (nano-wear) onto hydroxylated silicon substrates. This technique has been used to determine the three-dimensional orientation geometry of aliphatic part and phenyl rings of rubbed polystyrene on hydroxyl-terminated wafers. The PMIRRAS analysis of PS bulk and transfer film showed an orientation of chains under different mechanical stresses.
