Author/Authors :
Wei، نويسنده , , Xing-Chang and Xu، نويسنده , , Yi-Li and Meng، نويسنده , , Nan and Xu، نويسنده , , Yang and Hakro، نويسنده , , Ayaz and Dai، نويسنده , , Gao-Le and Hao، نويسنده , , Ran and Li، نويسنده , , Er-Ping، نويسنده ,
Abstract :
A non-contact method is proposed to characterize graphene at microwave frequency by combining Raman spectroscopy and Amphenol Precision Connector (APC-7). The CVD-grown graphene is transferred to the ring-shape Teflon substrate and characterized by Raman spectroscopy to estimate its doping density and the related Fermi energy. The graphene is then sandwiched between two APC-7 coaxial connectors and S parameters under transverse electromagnetic (TEM) mode normal incident waves are measured to extract the surface conductivity through transmission matrix, in which the de-embedding process can be avoided. By combing the Kubo formula with our proposed circuit model, the scattering rate of graphene on Teflon substrate is obtained and analyzed.
