Author/Authors :
Tommasini، نويسنده , , M. and Castiglioni، نويسنده , , C. and Zerbi، نويسنده , , G. and Barbon، نويسنده , , A. and Brustolon، نويسنده , , M.، نويسنده ,
Abstract :
Multi-wavelength Raman and EPR spectroscopies have been used on ball-milled graphite to investigate the effect of varying crystallite size and defect concentration. A correlation between Raman ID/IG intensity ratio and EPR T1 spin lattice relaxation time of conduction electrons has been discovered which could represent an appealing characterization technique for graphitic materials.
