Title of article :
In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus atmosphere
Author/Authors :
Hosokai، نويسنده , , T. and Hinderhofer، نويسنده , , A. and Vorobiev، نويسنده , , A. and Lorch، نويسنده , , Linda C. and Watanabe، نويسنده , , T. and Koganezawa، نويسنده , , T. M. Gerlach ، نويسنده , , A. and Yoshimoto، نويسنده , , N. and Kubozono، نويسنده , , Y. and Schreiber، نويسنده , , F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
5
From page :
34
To page :
38
Abstract :
Structure and morphology of picene films under vacuum and O 2 atmosphere were studied by in situ synchrotron X-ray scattering. We observed that picene films exhibit a highly oriented and ordered structure, which is similar to the one reported for picene single crystals. Furthermore, we found that the film structure determined under vacuum remains nearly unchanged under O 2 atmosphere. The results provide new insights into a high hole mobility and O 2 gas sensing mechanism previously reported for picene thin film-based organic field-effect transistors.
Journal title :
Chemical Physics Letters
Serial Year :
2012
Journal title :
Chemical Physics Letters
Record number :
1933540
Link To Document :
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