Title of article :
Dynamics of molecular excitons near a semiconductor surface studied by fluorescence quenching of polycrystalline tetracene on silicon
Author/Authors :
Piland، نويسنده , , Geoffrey B. and Burdett، نويسنده , , Jonathan J. and Hung، نويسنده , , Tzu-Yao and Chen، نويسنده , , Po-Hsun and Lin، نويسنده , , Chi-Feng and Chiu، نويسنده , , Tien-Lung and Lee، نويسنده , , Jiun-Haw and Bardeen، نويسنده , , Christopher J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
6
From page :
33
To page :
38
Abstract :
Tetracene, a molecule that undergoes singlet fission, is deposited on Si with variable thickness LiF spacer layers. In agreement with earlier work (Hayashi et al., 1983 [10]), the fluorescence intensity of the tetracene greatly increases as the LiF thickness approaches 100 nm. This increase is partly due to a 30% increase in the prompt fluorescence decay time but mostly results from weaker coupling of the luminescence into the Si substrate. A decrease in the prompt fluorescence lifetime is observed as the tetracene thickness is increased on bare Si. We find no evidence for triplet energy transfer to the Si.
Journal title :
Chemical Physics Letters
Serial Year :
2014
Journal title :
Chemical Physics Letters
Record number :
1936573
Link To Document :
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