Title of article
Dynamics of molecular excitons near a semiconductor surface studied by fluorescence quenching of polycrystalline tetracene on silicon
Author/Authors
Piland، نويسنده , , Geoffrey B. and Burdett، نويسنده , , Jonathan J. and Hung، نويسنده , , Tzu-Yao and Chen، نويسنده , , Po-Hsun and Lin، نويسنده , , Chi-Feng and Chiu، نويسنده , , Tien-Lung and Lee، نويسنده , , Jiun-Haw and Bardeen، نويسنده , , Christopher J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2014
Pages
6
From page
33
To page
38
Abstract
Tetracene, a molecule that undergoes singlet fission, is deposited on Si with variable thickness LiF spacer layers. In agreement with earlier work (Hayashi et al., 1983 [10]), the fluorescence intensity of the tetracene greatly increases as the LiF thickness approaches 100 nm. This increase is partly due to a 30% increase in the prompt fluorescence decay time but mostly results from weaker coupling of the luminescence into the Si substrate. A decrease in the prompt fluorescence lifetime is observed as the tetracene thickness is increased on bare Si. We find no evidence for triplet energy transfer to the Si.
Journal title
Chemical Physics Letters
Serial Year
2014
Journal title
Chemical Physics Letters
Record number
1936573
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