• Title of article

    Dynamics of molecular excitons near a semiconductor surface studied by fluorescence quenching of polycrystalline tetracene on silicon

  • Author/Authors

    Piland، نويسنده , , Geoffrey B. and Burdett، نويسنده , , Jonathan J. and Hung، نويسنده , , Tzu-Yao and Chen، نويسنده , , Po-Hsun and Lin، نويسنده , , Chi-Feng and Chiu، نويسنده , , Tien-Lung and Lee، نويسنده , , Jiun-Haw and Bardeen، نويسنده , , Christopher J.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2014
  • Pages
    6
  • From page
    33
  • To page
    38
  • Abstract
    Tetracene, a molecule that undergoes singlet fission, is deposited on Si with variable thickness LiF spacer layers. In agreement with earlier work (Hayashi et al., 1983 [10]), the fluorescence intensity of the tetracene greatly increases as the LiF thickness approaches 100 nm. This increase is partly due to a 30% increase in the prompt fluorescence decay time but mostly results from weaker coupling of the luminescence into the Si substrate. A decrease in the prompt fluorescence lifetime is observed as the tetracene thickness is increased on bare Si. We find no evidence for triplet energy transfer to the Si.
  • Journal title
    Chemical Physics Letters
  • Serial Year
    2014
  • Journal title
    Chemical Physics Letters
  • Record number

    1936573