Title of article :
Spherical cap-shaped emulsion films: thickness evaluation at the nanoscale level by the optical evanescent wave effect
Author/Authors :
Gabrieli، نويسنده , , R. and Loglio، نويسنده , , G. and Pandolfini، نويسنده , , P. and Fabbri، نويسنده , , A. and Simoncini، نويسنده , , M. and Kovalchuk، نويسنده , , V.I. and Noskov، نويسنده , , B.A. and Makievski، نويسنده , , A.V. and Krنgel، نويسنده , , J. and Miller، نويسنده , , R. and Ravera، نويسنده , , F. and Liggieri، نويسنده , , L.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Pages :
7
From page :
101
To page :
107
Abstract :
A new methodology, based on fundamental optical principles relevant to the evanescent wave properties, is developed to evaluate the thinning behavior and the local thickness in different positions for curved aqueous emulsion films, generated in a hydrocarbon matrix. This methodology is applied to test data obtained by a specially-designed bread-board cell. The generated films, constituted by an aqueous sodium dodecylsulfate solution at concentration c = 2.5 times the critical micellar concentration, remain stable during several hours. The results show a slow evolution of the film thickness as a function of time starting from micrometric dimension, at the initial film formation, to a few nanometres prior to film breakage. The action of the gravitational drainage is furthermore assessed by the local thickness values in different positions of the film profile. The illustrated examples demonstrate that the evanescent wave effect can be advantageously adopted as a complementary measurement technique, additional to the usual interferometric technique.
Keywords :
Emulsion film , Optical evanescent wave , Liquid film tensiometer , Liquid–liquid interfacial system , Aqueous solution of sodium dodecyl sulfate , n-decane
Journal title :
Colloids and Surfaces A Physicochemical and Engineering Aspects
Serial Year :
2012
Journal title :
Colloids and Surfaces A Physicochemical and Engineering Aspects
Record number :
1943122
Link To Document :
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