Title of article :
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
Author/Authors :
Kun-Lin Hsieh، نويسنده , , Lee-Ing Tong، نويسنده , , Min-Chia Wang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
12
From page :
765
To page :
776
Keywords :
Integrated circuits (IC) , Control chart , Defect clustering , Fuzzy theory
Journal title :
Expert Systems with Applications
Serial Year :
2007
Journal title :
Expert Systems with Applications
Record number :
198568
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=198568
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