Title of article
The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory
Author/Authors
Kun-Lin Hsieh، نويسنده , , Lee-Ing Tong، نويسنده , , Min-Chia Wang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
12
From page
765
To page
776
Keywords
Integrated circuits (IC) , Control chart , Defect clustering , Fuzzy theory
Journal title
Expert Systems with Applications
Serial Year
2007
Journal title
Expert Systems with Applications
Record number
198568
Link To Document