مرکز منطقه ای اطلاع رساني علوم و فناوري - Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression

Title of article :

Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression

Author/Authors :

Kun-Lin Hsieh، نويسنده , , Yen-Sheng Lu، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2008

Pages :

From page :

717

To page :

724

Keywords :

Yield model , Liquid crystal displays (LCDs) , Stepwise regression , Artificial neural networks (ANNs)

Journal title :

Expert Systems with Applications

Serial Year :

2008

Journal title :

Expert Systems with Applications

Record number :

198730

Link To Document :