Author/Authors :
Ryan، نويسنده , , C.G. and Kirkham، نويسنده , , Michael R. and Hough، نويسنده , , R.M. and Moorhead، نويسنده , , G. and Siddons، نويسنده , , D.P. and de Jonge، نويسنده , , M.D. and Paterson، نويسنده , , D.J. and De Geronimo، نويسنده , , G. and Howard، نويسنده , , D.L. and Cleverley، نويسنده , , J.S.، نويسنده ,
Abstract :
The fundamental parameter method for quantitative SXRF and PIXE analysis and imaging using the dynamic analysis method is extended to model the changing X-ray yields and detector sensitivity with angle across large detector arrays. The method is implemented in the GeoPIXE software and applied to cope with the large solid-angle of the new Maia 384 detector array and its 96 detector prototype developed by CSIRO and BNL for SXRF imaging applications at the Australian and NSLS synchrotrons. Peak-to-background is controlled by mitigating charge-sharing between detectors through careful optimization of a patterned molybdenum absorber mask. A geological application demonstrates the capability of the method to produce high definition elemental images up to ∼100 M pixels in size.
Keywords :
Fundamental parameter method , Trace element imaging , SXRF , dynamic analysis , PIXE , X-ray microprobe , Silicon detector
