Longitudinal diffraction scans using a position sensitive detector

A scattering geometry is proposed which combines energy dispersive X-ray diffraction with a high resolution energy analyzer. This allows high resolution longitudinal diffraction measurements on single crystals without adjustment of the scattering angles. If a position sensitive detector is used, a longitudinal diffraction pattern may be collected in parallel. The behavior of single crystals during rapid temperature changes can be observed with this technique. A broad bandpass source of X-rays, such as synchrotron radiation, and an analyzing crystal with a large mosaic spread are central to this technique. The resolution and range of the technique are verified experimentally, and applications are discussed.