The electron-conducting glass SCHOTT S8900 as substrata for microstrip gas chamber

DSRI participates in an international collaboration with the purpose to develop microstrip detectors comprising a glass substrata with an electrically conducting layer and a microstrip structure on its surface. This paper presents the results of the test made on the electron-conducting glass SCHOTT S8900. The following properties of the developed MS-plate have been investigated: gas gain uniformity, gas gain temporal stability and gas gain as function of photon fluxes up to 0.5 × 106 ph s−1 mm−2. The measurements and results are presented and discussed.