Author/Authors :
Gratchev، نويسنده , , V. and Mohammadi-Baarmand، نويسنده , , M. and Polychronakos، نويسنده , , V. and Shank، نويسنده , , J. and Tcherniatine، نويسنده , , V. and Vaniachine، نويسنده , , A.، نويسنده ,
Abstract :
Details are presented of a method to resolve close tracks in cathode strip chambers based on the fit to the induced charge distribution. The analysis of muon beam test data demonstrated a double track resolution of about 2 mm for a readout pitch of 5 mm. The degradation of the position resolution in the presence of a close track is limited to 10% of the readout pitch.
