Author/Authors :
Junghans، نويسنده , , A. and Clerc، نويسنده , , H.-G. and Grewe، نويسنده , , A. and de Jong، نويسنده , , M. and Müller، نويسنده , , J. and Schmidt، نويسنده , , K.-H.، نويسنده ,
Abstract :
The intensity of a 136Xe(600 A MeV) beam has been determined by simultaneously measuring the particle rate and the corresponding ionisation current with an ionisation chamber. The ionisation current of this self-calibrating device was compared at higher intensities with the current of a secondary-electron monitor and a calibration of the secondary-electron current was achieved with a precision of 2%. This method can be applied to all high-energy heavy-ion beams.