A lifetime correction method for the gamma-ray yield measurement in (n, χγ) experiments

A lifetime correction method for the gamma-ray yield measurement in (n, χγ) experiments performed by means of TOF technique is proposed. This method makes it possible to determine prompt and delayed gamma-ray data simultaneously in an experiment. It can separate the delayed component from a mixed gamma-ray peak exactly, so that completely pure prompt gamma-ray data can be obtained. It provides an in-beam measurement method for neutron activation cross sections. Especially, it has obvious advantages for yield measurements of decay gamma-rays with lifetimes ranging from 1 ns to several hours. Application techniques under various conditions are discussed. As examples, some results for F, Al and Si samples under 14.9 MeV neutron bombardment are given.